International Journal of Statistics and Applied Mathematics
  • Printed Journal
  • Indexed Journal
  • Refereed Journal
  • Peer Reviewed Journal

International Journal of Statistics and Applied Mathematics

2020, Vol. 5, Issue 2, Part B

An economic reliability test plan for exponentiated half logistic distributed lifetimes


Author(s): CH Ramesh Naidu, G Srinivasa Rao and K Rosaiah

Abstract: The exponentiated half logistic distribution introduced by Cordeiro et al. (2014) is a probability model for the life time of an item. A submitted lot will be accepted or rejected based on the sampling plans where items are to be tested and for collecting the life of items, these plans are called reliability test plans. The present reliability test plan is more desirable than similar plans exists in literature is entrenched with respect to termination time of the experiment. For a range of stated acceptance number we determine the minimum life test termination time, sample size, and producer’s risk.

Pages: 140-148 | Views: 29 | Downloads: 6

Download Full Article: Click Here
How to cite this article:
CH Ramesh Naidu, G Srinivasa Rao and K Rosaiah. An economic reliability test plan for exponentiated half logistic distributed lifetimes. International Journal of Statistics and Applied Mathematics. 2020; 5(2): 140-148.
Call for book chapter
International Journal of Statistics and Applied Mathematics